This paper presents the use of optical antennas in metrology scenarios. Two design concepts are presented: dielectric nanoresonator arrays and plasmonic nanoantennas arrays. The first ones are able to focus an incident light beam at an arbitrary focal plane. The nanoantennas arrays can be employed for collecting the high-spatial frequencies of any scattering environment and redirecting into far-field information. The first concept can be employed in the manufacturing of custom holographic surfaces for free-form optics characterization. The second concept is attractive for the development of highresolution, high-efficiency optical metrology instruments.