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Three-port interferometer in silicon-on-insulator for wavelength monitoring and displacement measurement

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Author: Harmsma, P. · Staats, J.P. · Lo Cascio, D.M.R. · Cheng, L.K.
Type:article
Date:2011
Source:2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, 22 May 2011 through 26 May 2011, Munich
Identifier: 435996
doi: doi:10.1109/CLEOE.2011.5943282
ISBN: 9781457705335
Article number: No.: 5943282
Keywords: Displacement measurements · Fiber Bragg grating (fbg) · Fixed wavelength · Interrogation system · Narrow bands · Optical signals · Path length difference · Silicon on insulator · Wavelength monitoring · Electron optics · Fiber Bragg gratings · Optics · Quantum electronics · Interferometers · Physics & Electronics · OPT - Optics · TS - Technical Sciences

Abstract

The wavelength of a narrow-band optical signal can be accurately tracked by means of an interferometer having a fixed path length difference. For example, a low-cost Fiber Bragg Grating (FBG) interrogation system which tracks the FBG reflection wavelength over time can be based on such an interferometer. Alternatively, an interferometer is operated at fixed wavelength to monitor displacement, as applied in metrology. © 2011 IEEE.