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A 300°C Dynamic-Feedback Instrumentation Amplifier

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Author: Jong, P.C. de · Meijer, G.C.M. · Roermund, A.H.M. van
Type:article
Date:1998
Institution: TNO Fysisch en Elektronisch Laboratorium
Source:IEEE Journal of Solid-State Circuits, 12, 33, 1999-2009
Identifier: 95152
Keywords: Physics · Dynamic feedback · High temperature · Instrumentation amplifiers · Leakage currents · CMOS integrated circuits · Resistors · Feedback amplifiers

Abstract

A high-temperature instrumentation amplifier that uses dynamic feedback is presented. It realizes dynamic feedback by means of a rotating chain of resistors to compensate for resistor mismatches. An 11x dynamic-feedback instrumentation amplifier has been integrated in a standard junction-isolated 1.6-μm CMOS process and realizes an average gain error below 25 ppm up to 250°C without calibration or trimming. Leakage currents cause additional gain errors at higher temperatures. Nevertheless, even at 300°C, this average gain error is still less than 500 ppm.