Print Email Facebook Twitter Characterization of Low-dimensional Structures by Advanced Transmission Electron Microscopy Title Characterization of Low-dimensional Structures by Advanced Transmission Electron Microscopy Author Yücelen, E. Contributor Zandbergen, H.W. (promotor) Faculty Applied Sciences Department Kavli Institute of Nanoscience Delft Date 2011-06-09 Abstract This thesis describes method development in TEM-related techniques and their application to the study of nanoprecipitates and low-dimensional structures. The work is divided into two parts. The first part is focused on the structures of nanoprecipitates found in Al-Co, Al-Ni and Al-Fe-Zr alloys. The second part describes the effect of accelerating voltage and its direct impact on image formation in different materials including the application of low acceleration voltages to the imaging of graphene single/double sheets quantitatively. Subject Electron MicroscopyElectron Diffraction To reference this document use: http://resolver.tudelft.nl/uuid:286a60a5-4daa-492c-8d6f-6ec7fe04ed74 Publisher Ipskamp Drukkers Embargo date 2011-06-08 ISBN 9789491211645 Part of collection Institutional Repository Document type doctoral thesis Rights (c) 2011 Yücelen, E. Files PDF EYucelen_Thesis.pdf 11.92 MB Close viewer /islandora/object/uuid:286a60a5-4daa-492c-8d6f-6ec7fe04ed74/datastream/OBJ/view