Terahertz scanning probe microscope

Title

Terahertz scanning probe microscope

 Author

Klapwijk, T.M.

Faculty

Applied Sciences

 Department

QN/Quantum Nanoscience

 Date

2014-08-28

 Abstract

The invention provides aterahertz scanning probe microscope setup comprising (i) a terahertz radiation source configured to generate terahertz radiation; (ii) a terahertz lens configured to receive at least part of the terahertz radiation from the terahertz radiation source; (iii) a cantilever unit comprising a cantilever with at its distal end an electrically conductive tip, a slot-line basedleaky wave antenna configured to receive at least part of the focused terahertz radiation, a stripline electrode with a terahertz radiation receiving part wave antenna and with a tip part in electrical conductive connection with the electrically conductive tip; (iv) a terahertz radiation receiver, configured to receive via the leaky wave antenna returning terahertz radiation from a sample.

 To reference this document use:

http://resolver.tudelft.nl/uuid:500dd083-a578-4874-a886-b0f099599b61

 Publisher

European Patent Office

 Source

http://worldwide.espacenet.com/publicationDetails/biblio?DB=EPODOC&II=8&ND=3&adjacent=true&locale=en_EP&FT=D&date=20140828&CC=WO&NR=2014129896A1&KC=A1

 Source

WO 2014129896 (A1)

 Part of collection

Institutional Repository

 Document type

patent

 Rights

(c) 2014 The Author(s)
Files
PDF WO2014129896A1.pdf 1.74 MB
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