Print Email Facebook Twitter Effect of polarization in evanescent wave amplification for the enhancement of scattering of nanoparticles on surfaces Title Effect of polarization in evanescent wave amplification for the enhancement of scattering of nanoparticles on surfaces Author Kolenov, D. (TU Delft ImPhys/Optics) Urbach, Paul (TU Delft ImPhys/Optics) Pereira, S.F. (TU Delft ImPhys/Optics) Date 2020 Abstract We demonstrate the far field detection of low-contrast nanoparticles on surfaces using a technique that is based on evanescent-wave amplification due to a thin dielectric layer that is deposited on the substrate. This research builds upon earlier results where scattering enhancement of 200 nm polystyrene (PSL) particles on top of a glass substrate covered with a ≈ 20 nm InSb layer has been observed by Roy et al. [Phys. Rev. A 96, 013814 (2017)]. In this paper, the enhancement effect is analyzed using other dielectric materials with lower absorption than the previous one, resulting in a higher signal-to-noise ratio (SNR) for particle detection. We also consider several polarizations of the incoming field, such as linear, circular, azimuthal, and radial. In our experiments, we observe that the optimum enhancement occurs when linear polarization is used. With this new scheme, PSL nanoparticles of 40 nm in diameter have been detected at a wavelength of 405 nm. Subject OA-Fund TU Delft To reference this document use: http://resolver.tudelft.nl/uuid:604c2e1a-8fe9-4e50-a76e-cbf25b9c47c0 DOI https://doi.org/10.1364/OSAC.385908 Source OSA Continuum, 3 (4), 742-758 Part of collection Institutional Repository Document type journal article Rights © 2020 D. Kolenov, Paul Urbach, S.F. Pereira Files PDF osac_3_4_742.pdf 1.2 MB Close viewer /islandora/object/uuid:604c2e1a-8fe9-4e50-a76e-cbf25b9c47c0/datastream/OBJ/view