Print Email Facebook Twitter In Situ transmission electron microscopy imaging of electromigration in platinum nanowires Title In Situ transmission electron microscopy imaging of electromigration in platinum nanowires Author Rudneva, M. Gao, B. Prins, F. Xu, Q. Van der Zant, H.S.J. Zandbergen, H.W. Faculty Applied Sciences Department Kavli Insitute of Nanoscience Date 2013-08-05 Abstract In situ transmission electron microscopy was performed on the electromigration in platinum (Pt) nanowires (14 nm thick, 200 nm wide, and 300 nm long) with and without feedback control. Using the feedback control mode, symmetric electrodes are obtained and the gap usually forms at the center of the Pt nanowire. Without feedback control, asymmetric electrodes are formed, and the gap can occur at any position along the wire. The three-dimensional gap geometries of the electrodes in the Pt nanowire were determined using high-angle annular dark-field scanning transmission electron microscopy; the thickness of the nanowire is reduced from 14 nm to only a few atoms at the edge with a gap of about 5–10 nm. Subject electromigrationtransmission electron microscopyin situ imaging To reference this document use: http://resolver.tudelft.nl/uuid:87977a26-a65c-43e2-b5fa-66ffd4d0c801 DOI https://doi.org/10.1017/S1431927613012300 Publisher Cambridge University Press Embargo date 2014-08-05 ISSN 1435-8115 Source Microscopy and Microanalysis, 19 (supplement S5), 2013 Part of collection Institutional Repository Document type journal article Rights (c) 2013 Microscopy Society of America Files PDF rudneva_gao.pdf 546.25 KB Close viewer /islandora/object/uuid:87977a26-a65c-43e2-b5fa-66ffd4d0c801/datastream/OBJ/view