Thermal Properties of NbN Single-Photon Detectors

Thermal Properties of NbN Single-Photon Detectors

Baeva, E. M. (National Research University Higher School of Economics; Chemistry Faculty of M. V. Lomonosov Moscow State University)
Sidorova, M. V. (Chemistry Faculty of M. V. Lomonosov Moscow State University; Deutsches Zentrum für Luft- und Raumfahrt e.V. (DLR))
Korneev, A. A. (National Research University Higher School of Economics; Chemistry Faculty of M. V. Lomonosov Moscow State University)
Smirnov, K. V. (LLC Superconducting Nanotechnology (Scontel); National Research University Higher School of Economics; Moscow State University of Education)
Divochy, A. V. (Chemistry Faculty of M. V. Lomonosov Moscow State University; LLC Superconducting Nanotechnology (Scontel))
Morozov, P. V. (LLC Superconducting Nanotechnology (Scontel))
Zolotov, P. I. (National Research University Higher School of Economics; Chemistry Faculty of M. V. Lomonosov Moscow State University; LLC Superconducting Nanotechnology (Scontel))
Vakhtomin, Yu B. (Chemistry Faculty of M. V. Lomonosov Moscow State University)
Klapwijk, T.M. (TU Delft QN/Klapwijk Lab; TU Delft QN/Quantum Nanoscience; Chemistry Faculty of M. V. Lomonosov Moscow State University; Kavli institute of nanoscience Delft)

QN/Quantum Nanoscience

2018

We investigate thermal properties of a NbN single-photon detector capable of unit internal detection efficiency. Using an independent calibration of the coupling losses, we determine the absolute optical power absorbed by the NbN film and, via resistive superconductor thermometry, the temperature dependence of the thermal resistance Z(T) of the NbN film. In principle, this approach permits simultaneous measurement of the electron-phonon and phonon-escape contributions to the energy relaxation, which in our case is ambiguous because of the similar temperature dependencies. We analyze Z(T) with a twoerature model and impose an upper bound on the ratio of electron and phonon heat capacities in NbN, which is surprisingly close to a recent theoretical lower bound for the same quantity in similar devices.

http://resolver.tudelft.nl/uuid:ab1845bf-f198-45df-9c01-efb411acd0f0

https://doi.org/10.1103/PhysRevApplied.10.064063

2331-7019

Physical Review Applied, 10 (6)

Institutional Repository

journal article

© 2018 E. M. Baeva, M. V. Sidorova, A. A. Korneev, K. V. Smirnov, A. V. Divochy, P. V. Morozov, P. I. Zolotov, Yu B. Vakhtomin, T.M. Klapwijk, More Authors