Print Email Facebook Twitter Miniature 10 kHz thermo-optic delay line in silicon Title Miniature 10 kHz thermo-optic delay line in silicon Author Margallo-Balbás, E. Geljon, M. Pandraud, G. French, P.J. Faculty Electrical Engineering, Mathematics and Computer Science Department Micro Electronics Date 2010-11-24 Abstract The scanning delay line is a key component of time-domain optical coherence tomography systems. It has evolved since its inception toward higher scan rates and simpler implementation. However, existing approaches still suffer from drawbacks in terms of size, cost, and complexity, and they are not suitable for implementation using integrated optics. In this Letter, we report a rapid scanning delay line based on the thermo-optic effect of silicon at ? ¼ 1:3 ?m manufactured around a generic planar lightwave circuit technology. The reported device attained line scan rates of 10 kHz and demonstrated a scan range of 0:95 mm without suffering any observable loss of resolution (15 ?m FWHM) owing to depth-dependent chromatic dispersion. To reference this document use: http://resolver.tudelft.nl/uuid:b9b745da-0d68-4cd3-a3b2-4666436a8716 DOI https://doi.org/10.1364/OL.35.004027 Publisher Optical Society of America ISSN 0146-9592 Source http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-23-4027 Source Optics Letters, 35 (23), 2010 Part of collection Institutional Repository Document type journal article Rights (c) 2010 Optical Society of America Files PDF French_2010.pdf 484.33 KB Close viewer /islandora/object/uuid:b9b745da-0d68-4cd3-a3b2-4666436a8716/datastream/OBJ/view