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Celano, Umberto (author), Hsia, Feng Chun (author), Vanhaeren, Danielle (author), Paredis, Kristof (author), Nordling, Torbjörn E.M. (author), Buijnsters, J.G. (author), Hantschel, Thomas (author), Vandervorst, Wilfried (author)
Wear mechanisms including fracture and plastic deformation at the nanoscale are central to understand sliding contacts. Recently, the combination of tip-induced material erosion with the sensing capability of secondary imaging modes of AFM, has enabled a slice-and-view tomographic technique named AFM tomography or Scalpel SPM. However, the...
journal article 2018