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Abarca Prouza, A.N. (author), Theuwissen, A.J.P.A.M. (author)
This article presents in-pixel (of a CMOS image sensor (CIS) temperature sensors with improved accuracy in the spatial and the temporal domain. The goal of the temperature sensors is to be used to compensate for dark (current) fixed pattern noise (FPN) during the exposure of the CIS. The temperature sensors are based on substrate parasitic...
journal article 2020
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Xie, S. (author), Abarca Prouza, A.N. (author), Theuwissen, A.J.P.A.M. (author)
This brief proposes employing each of the classical 4 transistor (4T) pinned photodiode (PPD) CMOS image sensor (CIS) pixels, for both imaging and temperature measurement, intended for compensating the CISs' dark current, and dark signal non-uniformity (DSNU). The proposed temperature sensors rely on the thermal behavior of MOSFETs working in...
journal article 2020
document
Xie, S. (author), Theuwissen, A.J.P.A.M. (author)
This paper analyzes and compensates for process and temperature dependency among a (Complementary Metal Oxide Semiconductor) CMOS image sensor (CIS) array. Both the analysis and compensation are supported with experimental results on the CIS’s dark current, dark signal non-uniformity (DSNU), and conversion gain (CG). To model and to...
journal article 2019
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Abarca Prouza, A.N. (author), Xie, S. (author), Markenhof, Jules (author), Theuwissen, A.J.P.A.M. (author)
In this work, a novel approach for measuring relative temperature variations across the active area of a CMOS image sensor itself is presented. 555 Image pixels have been replaced by temperature sensors pixels (Tixels) in the same pixel array layer. Both sensors, pixels and Tixels, utilize the same readout structure to obtain the data. This...
journal article 2018
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