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Aljuffri, A.A.M. (author), Huang, R. (author), Muntenaar, L.V.M. (author), Gaydadjiev, G. (author), Ma, Kezheng (author), Hamdioui, S. (author), Taouil, M. (author)The Advanced Encryption Standard (AES) is widely recognized as a robust cryptographic algorithm utilized to protect data integrity and confidentiality. When it comes to lightweight implementations of the algorithm, the literature mainly emphasizes area and power optimization, often overlooking considerations related to performance and security....journal article 2024
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Aljuffri, A.A.M. (author), Saxena, Mudit (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)Security is one of the most important features that a system must provide. Depending on the application of the target device, different threats should be considered at design time. However, the attack space is vast. Hence, it is difficult to decide what components to protect, what level of protection they require and how efficient they are in...conference paper 2023
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Siddiqi, M.A. (author), Hernández, Jan Andrés Galvan (author), Gebregiorgis, A.B. (author), Bishnoi, R.K. (author), Strydis, C. (author), Hamdioui, S. (author), Taouil, M. (author)Next-generation personalized healthcare devices are undergoing extreme miniaturization in order to improve user acceptability. However, such developments make it difficult to incorporate cryptographic primitives using available target tech-nologies since these algorithms are notorious for their energy consumption. Besides, strengthening these...conference paper 2023
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Gomony, Manil Dev (author), Gebregiorgis, A.B. (author), Fieback, M. (author), Geilen, Marc (author), Stuijk, Sander (author), Richter-Brockmann, Jan (author), Bishnoi, R.K. (author), Taouil, M. (author), Hamdioui, S. (author)This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these...conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Zhang, Ziwei (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memory (RRAM) is a potential technology to replace conventional memories by providing low power consumption and high-density storage. As various manufacturing vendors make significant efforts to push it to high-volume production and commercialization, high-quality and efficient test solutions are of great importance. This...conference paper 2023
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Yuan, S. (author), Zhang, Z. (author), Fieback, M. (author), Xun, H. (author), Marinissen, E. J. (author), Kar, G. S. (author), Rao, S. (author), Couet, S. (author), Taouil, M. (author), Hamdioui, S. (author)The development of Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) mass production requires high-quality test solutions. Accurate and appropriate fault modeling is crucial for the realization of such solutions. This paper targets fault modeling and test generation for all interconnect and contact defects in STT-MRAMs and shows that using the...conference paper 2023
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Yuan, S. (author), Taouil, M. (author), Fieback, M. (author), Xun, H. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Rao, Sidharth (author), Couet, Sebastien (author), Hamdioui, S. (author)The development of Spin-transfer torque magnetic RAM (STT-MRAM) mass production requires high-quality dedicated test solutions, for which understanding and modeling of manufacturing defects of the magnetic tunnel junction (MTJ) is crucial. This paper introduces and characterizes a new defect called Back-Hopping (BH); it also provides its...conference paper 2023
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Xun, H. (author), Yuan, S. (author), Fieback, M. (author), Taouil, M. (author), Hamdioui, S. (author), Aziza, Hassen (author)Many companies are heavily investing in the commercialization of Resistive Random Access Memories (RRAMs). This calls for a comprehensive understanding of manufacturing defects to develop efficient and high-quality test and diagnosis solutions to push high-volume production. This paper identifies and characterizes a new defect based on silicon...conference paper 2023
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Fieback, M. (author), Bradarić, Filip (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memory (RRAM, or ReRAM) is a promising memory technology to replace Flash because of its low power consumption, high storage density, and simple integration in existing IC production processes. This has motivated many companies to invest in this technology. However, RRAM manufacturing introduces new failure mechanisms and...conference paper 2023
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Köylü, T.C. (author), Reinbrecht, Cezar (author), Gebregiorgis, A.B. (author), Hamdioui, S. (author), Taouil, M. (author)Hardware security is currently a very influential domain, where each year countless works are published concerning attacks against hardware and countermeasures. A significant number of them use machine learning, which is proven to be very effective in other domains. This survey, as one of the early attempts, presents the usage of machine...journal article 2023
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Ghasempouri, Tara (author), Raik, Jaan (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)According to the World Economic Forum, cyberattacks are considered as one of the most important sources of risk to companies and institutions worldwide. Attacks can target the network, software, and/or hardware. Over the years, much knowledge has been developed to understand and mitigate cyberattacks. However, new threats have appeared in...journal article 2023
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Masoumian, S. (author), Maes, Roel (author), Wang, Rui (author), Yerriswamy, Karthik Keni (author), Schrijen, Geert-Jan (author), Hamdioui, S. (author), Taouil, M. (author)SRAM Physical Unclonable Functions (PUFs) are one of the popular forms of PUFs that can be used to generate unique identifiers and randomness for security purposes. Hence, their resilience to attacks is crucial. The probability of attacks increases when the SRAM PUF start-up values follow a predictable pattern which we refer to as bias. In this...conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Aziza, Hassen (author), Heidekamp, Mathijs (author), Copetti, Thiago (author), Poehls, Leticia Bolzani (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memories (RRAMs) are being commercialized with significant investment from several semiconductor companies. In order to provide efficient and high-quality test solutions to push high-volume production, a comprehensive understanding of manufacturing defects is significantly required. This paper identifies and characterizes...conference paper 2023
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Aouichi, A. (author), Yuan, S. (author), Fieback, M. (author), Rao, Siddharth (author), Kim, Woojin (author), Marinissen, Erik Jan (author), Couet, Sebastien (author), Taouil, M. (author), Hamdioui, S. (author)Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) are on their way to commercialization. However, obtaining high-quality test and diagnosis solutions for STT-MRAMs is challenging due to the existence of unique defects in Magnetic Tunneling Junctions (MTJs). Recently, the Device-Aware Test (DA-Test) method has been put forward as an effective...conference paper 2023
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Fieback, M. (author), Cardoso Medeiros, G. (author), Wu, L. (author), Aziza, Hassen (author), Bishnoi, R.K. (author), Taouil, M. (author), Hamdioui, S. (author)Resistive RAM (RRAM) is a promising technology to replace traditional technologies such as Flash, because of its low energy consumption, CMOS compatibility, and high density. Many companies are prototyping this technology to validate its potential. Bringing this technology to the market requires high-quality tests to ensure customer...journal article 2022
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Köylü, T.C. (author), Reinbrecht, Cezar (author), Brandalero, Marcelo (author), Hamdioui, S. (author), Taouil, M. (author)Fault injection attacks are a threat to all digital systems, especially to the ones conducting security sensitive operations. Recently, the strategy of observing the instruction flow to detect attacks has gained popularity. In this paper, we provide a comparative study between three hardware-based techniques (i.e., recurrent neural network (RNN)...journal article 2022
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Gebregiorgis, A.B. (author), Du Nguyen, H.A. (author), Yu, J. (author), Bishnoi, R.K. (author), Taouil, M. (author), Franky, Catthoor (author), Hamdioui, S. (author)Faster and cheaper computers have been constantly demanding technological and architectural improvements. However, current technology is suffering from three technology walls: leakage wall, reliability wall, and cost wall. Meanwhile, existing architecture performance is also saturating due to three well-known architecture walls: memory wall,...journal article 2022
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Wu, Lizhou (author), Rao, Siddharth (author), Taouil, M. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Hamdioui, S. (author)The popularity of perpendicular magnetic tunnel junction (pMTJ)-based spin-transfer torque magnetic random access memories (STT-MRAMs) is growing very fast. The performance of such memories is very sensitive to magnetic fields, including both internal and external ones. This article presents a magnetic-field-aware compact model of pMTJ, named...journal article 2022
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Cardoso Medeiros, G. (author), Fieback, M. (author), Gebregiorgis, A.B. (author), Taouil, M. (author), Poehls, L. B. (author), Hamdioui, S. (author)High-quality memory diagnosis methodologies are critical enablers for scaled memory devices as they reduce time to market and provide valuable information regarding test escapes and customer returns. This paper presents an efficient Hierarchical Memory Diagnosis (HMD) approach that accurately diagnoses faults in the entire memory. Faults are...conference paper 2022
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Köylü, T.C. (author), Fieback, M. (author), Hamdioui, S. (author), Taouil, M. (author)Fault injection attacks pose an important threat to security-sensitive applications, such as secure communication and storage. By injecting faults into instructions, an attacker can cause information leakage or denial-of-service. Hence, it is important to secure the sensitive parts not only by detecting faults in the executed instructions but...conference paper 2022