Searched for: collection%253Air
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document
Sammak, A. (author), Aminian, M. (author), Qi, L. (author), De Boer, W.B. (author), Charbon, E. (author), Nanver, L.K. (author)
The selective epitaxial growth of Ge-on-Si followed by in-situ deposition of a nm-thin Ga/B layer stack (PureGaB) has previously been shown to be a robust CMOS-compatible process for fabrication of Ge-on-Si photodiodes. In this paper, strategies to improve the control and reproducibility of PureGaB Ge-on-Si photodiode fabrication by reducing the...
journal article 2014
document
Sammak, A. (author), De Boer, W.B. (author), Nanver, L.K. (author)
A standard Si/SiGe ASM CVD reactor that was recently modified for merging GaAs and Si epitaxial growth in one system is utilized to achieve intrinsic and doped epitaxial Ge-on-Si with low threading dislocation and defect densities. For this purpose, the system is equipped with 2% diluted GeH4 as the main precursor gas for Ge deposition; and 0.7%...
journal article 2012
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Nanver, L.K. (author), Sammak, A. (author), Mohammadi, V. (author), Mok, K.R.C. (author), Qi, L. (author), Sakic, A. (author), Golshani, N. (author), Darakhshandeh, J. (author), Scholtes, T.M.L. (author), De Boer, W.B. (author)
Envisioning wide future relevance, work is reviewed here on the pure dopant deposition of boron (PureB), gallium (PureGa) and the combination of the two (PureGaB), as used in the fabrication of nanometer shallow p+n Si and/or Ge diodes. Focus is placed on the special properties that have put these diodes in a class apart: their ideal electrical...
journal article 2012
document
Sammak, A. (author), De Boer, W.B. (author), Nanver, L.K. (author)
conference paper 2012
document
Sammak, A. (author), De Boer, W. (author), Nanver, L.K. (author)
Selective epitaxial growth of crystalline Ge on Si in a standard ASM Epsilon 2000 CVD reactor is investigated for the fabrication of Ge p+n diodes. At the deposition temperature of 700?C, most of the lattice mismatch-defects are trapped within first 300nm of Ge growth and good quality single crystal Ge is achieved within a layer thickness of...
conference paper 2011
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Sammak, A. (author), De Boer, W. (author), Van den Bogaard, A. (author), Nanver, L.K. (author)
A commercial Chemical Vapor Deposition (CVD) system, the ASMI Epsilon 2000 designed for Si and SiGe epitaxy, has, for the first time, been equipped for the growth of GaAs compounds in a manner that does not exclude the use of the system also for Si-based depositions. With the new system, intrinsic, Si-doped and Ge-doped GaAs epitaxial layers...
journal article 2010
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