- document
-
Leeuwenhoek, M. (author), Groenewoud, Freek (author), van Oosten, Kees (author), Benschop, Tjerk (author), Allan, Milan P. (author), Groeblacher, S. (author)A reduction of the interprobe distance in multiprobe and double-tip scanning tunneling microscopy to the nanometer scale has been a longstanding and technically difficult challenge. Recent multiprobe systems have allowed for significant progress by achieving distances of ~30 nm using two individually driven, traditional metal wire tips. For...journal article 2020
- document
-
Leeuwenhoek, M. (author), Groeblacher, S. (author), Allan, Milan P. (author), Blanter, Y.M. (author)A double-tip scanning tunneling microscope with nanometer-scale tip separation has the ability to access the single-electron Green's function in real and momentum spaces based on second-order tunneling processes. Experimental realization of such measurements has been limited to quasi-one-dimensional systems due to the extremely small signal...journal article 2020
- document
-
Leeuwenhoek, M. (author), Norte, R.A. (author), Bastiaans, Koen M. (author), Cho, Doohee (author), Battisti, Irene (author), Blanter, Y.M. (author), Groeblacher, S. (author), Allan, Milan P. (author)We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called smart tips and show the possibility of device-based STM tips. Contrary to conventional etched metal wire...journal article 2019