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Van Haver, S. (author), Braat, J.J.M. (author), Pereira, S.F. (author)We propose a measurement approach that allows the determination of aberrations of a microlens by analyzing the through-focus intensity image it produces when the object is a point source. To simulate image formation by a microlens we apply the extended version of the Nijboer-Zernike diffraction theory (ENZ) that uses the Debye diffraction...conference paper 2010