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Rosso, M. (author), Van Steijn, V. (author), De Smet, L.C.P.M. (author), Sudhölter, E.J.R. (author), Kleijn, C.R. (author), Kreutzer, M.T. (author)
A self-similar reaction front develops in reactive ion etching when the ions penetrate channels of shallow height h. This relates to the patterning of microchannels using a single-step etching and bonding, as described by Rhee et al. [Lab Chip 5, 102 (2005)] . Experimentally, we report that the front location scales as xf ? ht1/2 and the width...
journal article 2011