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Al-Ars, Z. (author), Hamdioui, S. (author), Gaydadjiev, G. (author), Vassiliadis, S. (author)
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip caches, due to the high complexity of memory tests and to the large amount of transistors dedicated to such memories. This paper discusses the methodology used to develop effective and efficient cache tests, and the way it is implemented to optimize...
journal article 2008