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Seshan, V. (author), Arroyo, C.R. (author), Castellanos-Gomez, A. (author), Prins, F. (author), Perrin, M.L. (author), Janssens, S.D. (author), Haenen, K. (author), Nesládek, M. (author), Sudhölter, E.J.R. (author), De Smet, L.C.P.M. (author), Van der Zant, H.S.J. (author), Dulic, D. (author)A high-current annealing technique is used to fabricate nanogaps and hybrid diamond/graphite structures in boron-doped nanocrystalline diamond films. Nanometer-sized gaps down to ?1?nm are produced using a feedback-controlled current annealing procedure. The nanogaps are characterized using scanning electron microscopy and electronic transport...journal article 2012
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Eijt, S.W.H. (author), De Roode, J. (author), Schut, H. (author), Kooi, B.J. (author), De Hosson, J.T.M. (author)Coimplantation of Zn and O ions into a single crystalline MgO and subsequent thermal annealing were applied in the synthesis of ZnO nanocrystals. Electron microscopy showed that rocksalt instead of wurtzite ZnO stabilizes for relatively large nanocrystals up to ~15?nm, resulting from its small lattice mismatch with MgO of ~1.7%. The vacancies...journal article 2007
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Cheynet, M.C. (author), Pokrant, S. (author), Tichelaar, F.D. (author), Rouvière, J.L. (author)Valence electron energy loss spectroscopy (VEELS) and high resolution transmission electron microscopy (HRTEM) are performed on three different HfO2 thin films grown on Si (001) by chemical vapor deposition (CVD) or atomic layer deposition (ALD). For each sample the band gap (Eg) is determined by low-loss EELS analysis. The Eg values are then...journal article 2007