Simultaneous measurement of position and color of single fluorescent emitters using diffractive optics

We propose a method for simultaneously measuring the position and emission color of single fluorescent emitters based on the use of a large pitch diffraction grating in the emission light path. The grating produces satellite spots adjacent to the main spot; the relative distance between the spots is a measure for the emission wavelength. We...

Three-dimensional structured illumination microscopy using Lukosz bound apodization reduces pixel negativity at no resolution cost

The quality of the reconstructed image in structured illumination microscopy (SIM) depends on various aspects of the image filtering process. To optimize the trade-off between resolution and ringing artifacts, which lead to negative intensities, we extend Lukosz-bound filtering to 3D SIM and derive the parametrization of the 3D SIM cut-off. We...

Position and orientation estimation of fixed dipole emitters using an effective Hermite point spread function model

We introduce a method for determining the position and orientation of fixed dipole emitters based on a combination of polarimetry and spot shape detection. A key element is an effective Point Spread Function model based on Hermite functions. The model offers a good description of the shape variations with dipole orientation and polarization...

Accuracy of the Gaussian Point Spread Function model in 2D localization microscopy

The Gaussian function is simple and easy to implement as Point Spread Function (PSF) model for fitting the position of fluorescent emitters in localization microscopy. Despite its attractiveness the appropriateness of the Gaussian is questionable as it is not based on the laws of optics. Here we study the effect of emission dipole orientation in...