Searched for: subject%3A%22Acceleration%22
(1 - 5 of 5)
document
Rocchetta, Roberto (author), Zhan, Zhouzhao (author), van Driel, W.D. (author), Di Bucchianico, Alessandro (author)
Lifetime analyses are crucial for ensuring the durability of new Light-emitting Diodes (LEDs) and uncertainty quantification (UQ) is necessary to quantify a lack of usable failure and degradation data. This work presents a new framework for predicting the lifetime of LEDs in terms of lumen maintenance, effectively quantifying the natural...
journal article 2024
document
Thukral, V. (author), Bacquet, Irene (author), Van Soestbergen, Michiel (author), Zaal, Jeroen (author), Roucou, Romuald (author), Rongen, Rene (author), van Driel, W.D. (author), Zhang, Kouchi (author)
Board level vibration testing is a commonly used method to predict the solder joint reliability of surface-mounted components seated onto printed circuit boards (PCB). Current board level vibration test methods are mainly developed from a solely mechanical stress application standpoint. This makes such stress tests one dimensional in nature...
conference paper 2023
document
van Driel, W.D. (author), Jacobs, B. (author), Watte, P. (author), Zhao, X. (author)
Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification...
journal article 2022
document
Herzog, Alexander (author), Wagner, Max (author), Benkner, Simon (author), Zandi, Babak (author), van Driel, W.D. (author), Khanh, Tran Quoc (author)
We report on the degradation dynamics and mechanisms of the commercially available chip-on-board (COB) high-power light-emitting diode (LED) modules with an electrical power of 175 W. Due to the associated thermal load, the temperature dependence of the aging processes is additionally analyzed within the scope of this work. The aging tests...
journal article 2022
document
Vos, T. (author), den Breeijen, P. (author), van Driel, W.D. (author)
In the past 4 years we have witnessed a change in quality and reliability to make the marked introduction of solid-state lighting (SSL) successful. LED penetration levels have reached values of 10–30%, depending on the application. The number and variety of LED packages and, thus, associated LED-based products, have significantly increased in...
book chapter 2018
Searched for: subject%3A%22Acceleration%22
(1 - 5 of 5)