PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory

Emerging non-volatile resistive memories like Spin-Transfer Torque Magnetic Random Access Memory (STT-MRAM) and Resistive RAM (RRAM) are in the focus of today’s research. They offer promising alternative computing architectures such as computation-in-memory (CiM) to reduce the transfer overhead between CPU and memory, usually referred to as the...

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs

The manufacturing process of STT-MRAM requires unique steps to fabricate and integrate magnetic tunnel junction (MTJ) devices which are data-storing elements. Thus, understanding the defects in MTJs and their faulty behaviors are paramount for developing high-quality test solutions. This article applies the advanced device-aware test to...

CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out

Spin-transfer torque magnetic random access memory (STT-MRAM) based computation-in-memory (CIM) architectures have shown great prospects for an energy-efficient computing. However, device variations and non-idealities narrow down the sensing margin that severely impacts the computing accuracy. In this work, we propose an adaptive referencing...

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions

As STT-MRAM mass production and deployment in industry is around the corner, high-quality yet cost-efficient manufacturing test solutions are crucial to ensure the required quality of products being shipped to end customers. This dissertation focuses on STT-MRAM testing, covering three abstraction levels: manufacturing defects, fault models, and...