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Botman, A. (author), Hagen, C.W. (author), Li, J. (author), Thiel, B.L. (author), Dunn, K.A. (author), Mulders, J.J.L. (author), Randolph, S. (author), Toth, M. (author)The material grown in a scanning electron microscope by electron beam-induced deposition (EBID) using Pt(PF3)4 precursor is shown to be electron beam sensitive. The effects of deposition time and postgrowth electron irradiation on the microstructure and resistivity of the deposits were assessed by transmission electron microscopy, selected area...journal article 2009
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Khalili Amiri, P. (author), Zhuang, Y. (author), Schellevis, H. (author), Rejaei, B. (author), Vroubel, M. (author), Ma, Y. (author), Burghartz, J.N. (author)This work presents a series of high-resistivity nanogranular Co–Al–O films with maximum resistivity of ? 110?m??cm. The films were deposited using pulsed dc reactive sputtering of a Co72Al28 target in an oxygen/argon ambient. The samples were characterized by scanning electron microscopy (SEM), M-H loop measurements, and s-parameter measurements...journal article 2007
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- Van der Zant, H.S.J. (author), Mantel, O.C. (author), Heij, C.P. (author), Dekker, C. (author) journal article 1997
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- Mantel, O.C. (author), Van der Zant, H.S.J. (author), Steinfort, A.J. (author), Traeholt, C. (author), Dekker, C. (author) journal article 1997