Reliable and Energy-efficient Diabetic Retinopathy Screening using Memristor-based Neural Networks

Diabetic retinopathy (DR) is a leading cause of permanent vision loss worldwide. It refers to irreversible retinal damage caused due to elevated glucose levels and blood pressure. Regular screening for DR can facilitate its early detection and timely treatment. Neural network-based DR classifiers can be leveraged to achieve such screening in...

On the Reliability of RRAM-Based Neural Networks

Emerging device technologies such as Resistive RAMs (RRAMs) are under investigation by many researchers and semiconductor companies; not only to realize e.g., embedded non-volatile memories, but also to enable energy-efficient computing making use of new data processing paradigms such as computation-in-memory. However, such devices suffer from...

Special Session: STT-MRAMs: Technology, Design and Test

STT-MRAM has long been a promising non-volatile memory solution for the embedded application space owing to its attractive characteristics such as non-volatility, low leakage, high endurance, and scalability. However, the operating requirements for high-performance computing (HPC) and low power (LP) applications involve different challenges....

Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes

SRAM Physical Unclonable Functions (PUFs) are among other things today commercially used for secure primitives such as key generation and authentication. The quality of the PUFs and hence the security primitives, depends on intrinsic variations which are technology dependent. Therefore, to sustain the commercial usage of PUFs for cutting-edge...

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory

Emerging non-volatile resistive memories like Spin-Transfer Torque Magnetic Random Access Memory (STT-MRAM) and Resistive RAM (RRAM) are in the focus of today’s research. They offer promising alternative computing architectures such as computation-in-memory (CiM) to reduce the transfer overhead between CPU and memory, usually referred to as the...

Using STLs for Effective In-field Test of GPUs

Editor's notes: GPUs have seen an increased adoption in autonomous systems. This article assesses the fault coverage that can be attained through software self-test strategies for in-field test of GPUs. - Nicola Nicolici, McMaster University

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects

Fin Field-Effect Transistor (FinFET) technology enables the continuous downscaling of Integrated Circuits (ICs), using the Complementary Metal-Oxide Semiconductor (CMOS) technology in accordance with the More Moore domain. Despite demonstrating improvements on short channel effect and overcoming the growing leakage problem of planar CMOS...

Exploiting Approximate Computing for implementing Low Cost Fault Tolerance Mechanisms

Today's computer architectures and semiconductor technologies are facing major challenges making them incapable to deliver the required features (such as computer efficiency) for emerging applications. Alternative architectures are being under investigation in order to continue deliver sustainable benefits for the foreseeable future society...

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

Fin Field-Effect Transistor (FinFET) technology enables the continuous downscaling of Integrated Circuits (ICs), using the Complementary Metal-Oxide Semiconductor (CMOS) technology in accordance with the More Moore domain. Despite demonstrating improvements on short channel effect and overcoming the growing leakage problem of planar CMOS...

On the Analysis of Real-time Operating System Reliability in Embedded Systems

Nowadays, the reliability has become one of the main issues for safety-critical embedded systems, like automotive, aerospace and avionic. In an embedded system, the full system stack usually includes, between the hardware layer and the software/application layer, a middle layer composed by the Operating System (OS) and the middleware. Most of...

RRAM Variability and its Mitigation Schemes

Emerging technologies such as RRAMs are attracting significant attention, due to their tempting characteristics such as high scalability, CMOS compatibility and non-volatility to replace the current conventional memories. However, critical causes of hardware reliability failures (such as process variation due to their nano-scale structure) have...