Testability and Fault Tolerance for Emerging Nanoelectronic Memories

Emerging nanoelectronic memories such as Resistive Random Access Memories (RRAMs) are possible candidates to replace the conventional memory technologies such as SRAMs, DRAMs and flash memories in future computer systems. Despite their advantages such as enormous storage capacity, low-power per unit device and reduced manufacturing difficulties,...

Performance-Oriented Fault Tolerance in Computing Systems

In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to technology trends such as decreasing feature sizes and lowering voltage levels, FT is becoming increasingly important in modern computing systems. FT techniques are based on some form of redundancy. It can be space redundancy (additional hardware),...

Fault-tolerant architectures for nanoelectronic and quantum devices

The progress in CMOS technology has entered the sub-micron realm, and the technology will approach its limits within about 15 years. Already various novel information processing devices, based on quantum mechanical effects at the nanometer scale, have been widely investigated and some have been successfully demonstrated at the circuit level....