Disorder strongly enhances Auger recombination in conductive quantum-dot solids

Auger recombination (AR) can be an important loss mechanism for optoelectronic devices, but it is typically not very efficient at low excitation densities. Here we show that in conductive quantum-dot solids, AR is the dominant charge carrier decay path even at excitation densities as low as 10?3 per quantum dot, and that AR becomes faster as the...