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Gaitas, A. (author), Zhu, W. (author), Gulari, N. (author), Covington, E. (author), Kurdak, C. (author)Metal microbolometers, used in scanning thermal microscopy, were microfabricated from <20?nm titanium thin films on SiO2/Si3N4/SiO2 cantilevers. These thin films are near the metal-insulator transition regime such that as the film thickness decreases—the resistance increases and the current-voltage characteristics cross over from sublinear to...journal article 2009
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Kooi, J.W. (author), Baselmans, J.J.A. (author), Hajenius, M. (author), Gao, J.R. (author), Klapwijk, T.M. (author), Dieleman, P. (author), Baryshev, A. (author), De Lange, G. (author)The intermediate frequency (IF) characteristics, the frequency dependent IF impedance, and the mixer conversion gain of a small area hot electron bolometer (HEB) have been measured and modeled. The device used is a twin slot antenna coupled NbN HEB mixer with a bridge area of 1Ă—0.15??m2, and a critical temperature of 8.3?K. In the experiment the...journal article 2007
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Barends, R. (author), Hajenius, M. (author), Gao, J.R. (author), Klapwijk, T.M. (author)We present a description of the current-voltage characteristics of hot electron bolometers in terms of the current-dependent intrinsic resistive transition of NbN films. We find that, by including this current dependence, we can correctly predict the complete current-voltage characteristics, showing excellent agreement with measurements for both...journal article 2005