Double Zernike expansion of the optical aberration function from its power series expansion

Enabling aberration retrieval of microlenses with the Extended Nijboer-Zernike (ENZ) diffraction theory

High-accuracy long-distance measurements in air with a frequency comb laser

Vectorial aerial-image computations of three-dimensional objects based on the extended Nijboer–Zernike theory

Licht-donker, 0-1, zwart-wit

General polarized ray-tracing method for inhomogeneous uniaxially anisotropic media

General imaging of advanced 3D mask objects based on the fully-vectorial Extended Nijboer-Zernike (ENZ) theory

Extended Nijboer-Zernike (ENZ) based mask imaging: Efficient coupling of electromagnetic field solvers and the ENZ imaging algorithm

Vectorial analysis of polarization issues in multi-axial nulling interferometers for exoplanet detection

Design of a polarization nulling interferometer for exoplanet detection

Optimum synthetic-aperture imaging of extended astronomical objects

Development of a liquid based deformable mirror

Nulling interferometry for exoplanet detection using polarization properties

Nulling interferometry without achromatic phase shifters: Latest results

Polarization nulling interferometry for exoplanet detection

Aerial image based lens metrology for wafer steppers

Liquid deformable mirror for high-order wavefront correction

Chromatism compensation in wide-band nulling interferometry for exoplanet detection

Estimating resist parameters in optical lithography using the extended Nijboer-Zernike theory

High-density optical data storage