Spontaneous resistance switching and low-frequency noise in quantum point contacts

Title

Spontaneous resistance switching and low-frequency noise in quantum point contacts

Author

Dekker, C.
Scholten, A.J.
Liefrink, F.
Eppenga, R.
Van Houten, H.
Foxon, C.T.

Date

1991-04-22

Subject

A7220J Charge carriers: generation, recombination, lifetime, and trapping semiconductors/insulators
A7270 Noise processes and phenomena in electronic transport
A7320D Electron states in low dimensional structures
A7340L Electrical properties of semiconductor to semiconductor contacts, p n junctions, and heterojunctions
carrier mobility
charge transport
conductance
electron device noise
electron traps
electrostatic potential
frequency dependence
INSPEC
local electrostatic potential
low frequency noise
low frequency noise spectroscopy
model
noise
point contacts
quantum point contact
quantum point contacts
quantum size effect
resistance
resistance switching
semiconductor quantum dots
semiconductors
size effect
spectral density
temperature dependence
transport
trapping
white noise

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ISSN

0031-9007

Source

Physical Review Letters 66(16), 2148-2151. (1991)

Part of collection

Institutional Repository

Document type

journal article