Noise in sub-micron CMOS image sensors

Doctoral thesis (2008)

Authors

Contributors

A.J.P. Theuwissen (promotor)
Faculty
Electrical Engineering, Mathematics and Computer Science (EEMCS) (TU Delft)
Copyright: © 2008 Wang, X.
Cmos image sensors Temproal noise Buried-channel source follower Rts noise
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Published Date

03-11-2008

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ISBN:

978-90-813316477

Faculty

Electrical Engineering, Mathematics and Computer Science

Abstract

CMOS image sensors are devices that convert illumination signals (light intensity) into electronic signals. The goal of this thesis has been to analyze dominate noise sources in CMOS imagers and to improve the image quality by reducing the noise generated in the CMOS image sensor pixels.