In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy

Journal article (2007)
Department
Kavli Institute of Nanoscience (AS) (TU Delft)
Copyright: © 2007 The Author(s); American Institute of Physics
DOI: https://doi.org/doi:10.1063/1.2767149
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Published Date

17-08-2007

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Source:

Applied Physics Letters, 91 (7), 2007

ISSN:

0003-6951

ISBN:

0003-6951

Source:

http://link.aip.org/link/APPLAB/v91/i7/p072107/s1

Faculty

Applied Sciences

Department

Kavli Institute of Nanoscience

Abstract

The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of the break, a relatively large deformation of the constriction’s geometry occurs. The shape of the anode (blunt) and the cathode (sharp) is asymmetric when the wire breaks with a bias voltage applied, but symmetric when a narrow constriction breaks spontaneously.

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