Three state-of-the-art methods for condition monitoring

Journal article (1999)
Copyright: © 1999 Grimmelius, H.T.; Meiler, P.P.; Maas, H.L.M.M.; Bonnier, B.; Grevink, J.S.; van Kuilenburg, R.F.
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Published Date

1999

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Source:

IEEE Transactions on Industrial Electronics, 46 (2)

ISSN:

0278-0046