YX

Y. Xu

View Pure Profile

Authored

8 records found

A Potential-Based Characterization of the Transfer Gate in CMOS Image Sensors
Journal article - Y. Xu, X. Ge, A.J.P.A.M. Theuwissen
A method to characterize the transfer gate (TG)- related parameters in a 4 T pixel is presented. The method is based on the pinning voltage measurement, which is proposed by Tan et al.[1] Using this method, the TG ON and OFF surface potential can be characterized. Based on the TG ...

Charge Domain Interlace Scan Implementation in a CMOS Image Sensor
Conference paper - Y. Xu, AJ Mierop, A.J.P.A.M. Theuwissen

Investigating transfer gate potential barrier by feed-forward effect measurement
Conference paper - Y. Xu, X. Ge, A.J.P.A.M. Theuwissen

Column-parallel digital correlated multiple sampling for low-noise CMOS image sensors

Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers

A 0.7 e- rms temporal-readout-noise CMOS image sensor for low-light-level imaging

Charge Domain Interlace Scan Implementation in a CMOS Image Sensor
Journal article - Y. Xu, A. Mierop, A.J.P.A.M. Theuwissen

A CMOS image sensor with charge domain interlace scan
Conference paper - Y. Xu, A. Mierop, A.J.P.A.M. Theuwissen