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XJ
X Jehl
1 records found
1
Authored
Sample variability and time stability in scaled silicon nanowires.
Conference paper (2009) -
M Pierre
,
X Jehl
,
GP Lansbergen
,
S. Rogge
,
M. Ruoff
,
M. Fleischer
,
D. Wharam
,
D. Kern
,
R. Wacquez
,
M. Vinet
,
M. Sanquer
,
M. Belli
,
E. Prati
,
M. Fanciulli
,
J. Verduijn
,
GC Tettamanzi
