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SS
S Sluyterman
View Pure Profile
Authored
2 records found
Field of inserted charges during Scanning Electron Microscopy of non-conducting samples
Conference paper -
T Amlaki
,
N.V. Budko
,
J Teunissen
,
B.J. Thijsse
,
J.M. Thijssen
,
Eric Bosch
,
N Debernardi
,
U Ebert
,
V Leung
,
M Mink
,
C Prastani
,
S Sluyterman
,
Marieke Snelder
PureB single-photon avalanche diodes for low-energy electron detection down to 200 eV
Journal article -
L. Qi
,
S Sluyterman
,
K Kooijman
,
C. Mok Kai Rine
,
L.K. Nanver