Interrogating and manipulating at the nanometre scale : from scientific instrumentation to industrial applications

NEMS based tools for nanoscience and atomic clocks

Integration of a fabrication process for an aluminum single-electron transistor and a scanning force probe for tuning-fork-based probe microscopy

Advanced scanning probes for micro-nano science researchers

Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy

Sub-ppm detection of vapors using piezoresistive microcantilever array sensors

Scanning force microscope for planetary research on Mars

Electro less deposition and structuring of silver electrodes inside closed micro fluidic channels

Quantitative AFM-SECM analysis with conductive cantilevers

Evaporation based micro pump integrated into a scanning force microscope probe

Conductive supports for combined AFM¿SECM on biological membranes

Dynamic behavior of the tuning fork AFM probe

Micro- and nanosystems for biology and medicine

Advanced temperature compensation for piezoresistive sensors based on crystallographic orientation

Concept and demonstration of individual probe actuation in two-dimensional parallel Atomic force microscope system

Comparison of two redox couples for AFM-SECM