Interrogating and manipulating at the nanometre scale : from scientific instrumentation to industrial applications

NEMS based tools for nanoscience and atomic clocks

Integration of a fabrication process for an aluminum single-electron transistor and a scanning force probe for tuning-fork-based probe microscopy

Advanced scanning probes for micro-nano science researchers

Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy

Electro less deposition and structuring of silver electrodes inside closed micro fluidic channels

Sub-ppm detection of vapors using piezoresistive microcantilever array sensors

Scanning force microscope for planetary research on Mars

Conductive supports for combined AFM¿SECM on biological membranes

Quantitative AFM-SECM analysis with conductive cantilevers

Evaporation based micro pump integrated into a scanning force microscope probe

Dynamic behavior of the tuning fork AFM probe

Concept and demonstration of individual probe actuation in two-dimensional parallel Atomic force microscope system

Advanced temperature compensation for piezoresistive sensors based on crystallographic orientation

Micro- and nanosystems for biology and medicine

Comparison of two redox couples for AFM-SECM