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Dynamic behavior of the tuning fork AFM probe

Journal article - D Bayat, T Akiyama, NF de Rooij, U. Staufer

Evaporation based micro pump integrated into a scanning force microscope probe

Journal article - FCA Heuck, T Hug, T Akiyama, PLTM Frederix, U. Staufer

Integration of a fabrication process for an aluminum single-electron transistor and a scanning force probe for tuning-fork-based probe microscopy

Journal article - K Suter, T Akiyama, NF de Rooij, M Huefner, U. Staufer

Concept and demonstration of individual probe actuation in two-dimensional parallel Atomic force microscope system

Journal article - T Akiyama, L Aeschiman, L Chantada, NF de Rooij, U. Staufer

NEMS based tools for nanoscience and atomic clocks

Conference paper - NF de Rooij, S. Gautsch, T Akiyama, F Loizeau, G Mileti, Y Petremand, U. Staufer, R Straessle, G Yoshikawa

Advanced temperature compensation for piezoresistive sensors based on crystallographic orientation

Journal article - BW Chui, L Aeschimann, T Akiyama, U. Staufer

Scanning force microscope for planetary research on Mars

Journal article - U. Staufer, D Parrat, T Akiyama, S. Gautsch

Quantitative AFM-SECM analysis with conductive cantilevers

Conference paper - PLTM Frederix, PD Bosshart, M Chami, T Akiyama, NF de Rooij, U. Staufer, A Engel

Comparison of two redox couples for AFM-SECM

Conference paper - PLTM Frederix, PD Bosshart, A Engel, T Akiyama, NF de Rooij, U. Staufer

Electro less deposition and structuring of silver electrodes inside closed micro fluidic channels

Conference paper - FCA Heuck, Pasqualina M Sarro, JHCM Slabbekoorn, T Akiyama, U. Staufer

Conductive supports for combined AFM¿SECM on biological membranes

Journal article - PLTM Frederix, PD Bosshart, T Akiyama, M Chami, U. Staufer

Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy

Journal article - T Akiyama, NF de Rooij, U. Staufer, M Detterbeck

Interrogating and manipulating at the nanometre scale : from scientific instrumentation to industrial applications

Conference paper - U. Staufer, T Akiyama, S. Gautsch, D Parrat, NF de Rooij, R Imer

Advanced scanning probes for micro-nano science researchers

Journal article - T Akiyama, S. Gautsch, D Parrat, R Imer, P Vettiger, U. Staufer, NF de Rooij

Sub-ppm detection of vapors using piezoresistive microcantilever array sensors

Journal article - G Yoshikawa, HP Lang, T Akiyama, L Aeschimann, U. Staufer

Micro- and nanosystems for biology and medicine

Journal article - U. Staufer, T Akiyama, MR Gullo, A Han, R Imer, NF de Rooij

T Akiyama

Authored