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3 records found
A back-wafer contacted silicon-on-glass integrated bipolar process - Part I: the conflict electrical versus thermal isolation
Journal article -
L.K. Nanver
,
N Nenadovic
,
V d' Alessandro
,
H. Schellevis
,
H.W. van Zeijl
,
R. Dekker
,
DB de Mooij
,
V Zieren
,
JW Slotboom
Impact ionization in thin silicon diodes
Journal article -
P Agarwal
,
MJ Goossens
,
V Zieren
,
E Aksen
,
JW Slotboom
Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors
Conference paper -
N Nenadovic
,
L.K. Nanver
,
H. Schellevis
,
D de Mooij
,
V Zieren
,
JW Slotboom