22 records found
1
Improved RSOL planar calibration via EM modelling and reduced spread resistive layers
SiGe heterojunction bipolar transistors with Schottky collector contacts
Lateral-transistor test structures for evaluating the effectiveness of surface doping techniques
Lateral bipolar structures for evaluating the effectiveness of surface doping techniques
Simple method to evaluate minority carrier injection levels in schottky diodes
Pure boron chemical vapor deposited layers; A new material for silicon device processing
Deep p+ junctions formed by drive-in from pure boron depositions
Arbitrarily shallow arsenic deposited junctions on silicon tuned by excimer laser annealing
Chemical Vapor Deposition of Gallium on Silicon and SiO2
Analytical Carrier Transport Model for Arbitrarily Shallow p-n Junctions
Application of amorphous boron layer as diffusion barrier for pure aluminium
SiGe HBTs implemented with implanted laser-annealed emitters to completely eliminate the transient enhanced diffusion
Analytical carrier transport model for arbitrary shallow p-n junctions
Special RF/microwave devices in silicon-on-glass technology
Reduction of alloying temperature of metallization stacks containing Al/Ti/TiN from 400 to 300°C
Ultra-low-temperature process modules for back-wafer-contacted silicon-on-glass RF/microwave technology
RF/microwave device fabrication in silicon-on-glass technology
Evaluation of al-doped SPE ultrashallow P+N junctions for use as PNP SiGe HBT emitters
JFET test structures for monitoring strain-enhanced mobility
Silicon-on-glass technology for RF and microwave device fabrication