5 records found
1
Verification of the simultaneous local extraction method of base and thermal resistance of bipolar transistors
Analysis of the local extraction method of base and thermal resistance of bipolar transistors
RF-noise modeling in advanced CMOS technologies
RF-noise modeling in MOSFETs: Excess noise, symmetry, and causality
QUBiC4X: An f/sub T//f/sub max/ = 130/140GHz SiGe:C-BiCMOS manufacturing technology witg elite passives for emerging microwave applications