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A Schreiner
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Authored
3 records found
XRD Characterization for TiN, Ti(C,N) and (Ti,Al)N Coatings in War Processes
Abstract -
D Munteanu
,
A. Duta
,
N van Landschoot
,
A Munteanu
,
A Schreiner
Quality control measurements for fluoroscopy system in eight countries participating in the SENTINEL EU coordination action
Journal article -
J. Zoetelief
,
FW Schultz
,
J Vassileva
,
S Kottou
,
L Gray
,
U O'Connor
,
D Salat
,
K Kepler
,
P Kaplanis
,
J Jankowski
,
A Schreiner
XRD Characterization for TiN, Ti(C,N) and (Ti,Al)N coatings in wear processes
Poster -
D Munteanu
,
A. Duta
,
N van Landschoot
,
A Munteanu
,
A Schreiner