To this day, elucidating the charge transfer process in electrode materials upon electrochemical cycling remains a challenge, primarily due to the complexity of chemical reactions at the electrode surfaces. Here, we present an elegant and reliable method to probe bulk-sensitive soft edges for elucidating anodic and cathodic charge compensation contribution via X-ray Raman scattering spectroscopy. By using a hard X-ray incident beam, this technique circumvents surface limitations and is practically free of self-absorption due to its nonresonant nature. In addition, it does not require complex sample preparation or experimental setups, making it an ideal tool for potential in situ analysis of the electronic structure of electrode materials. In this study, we monitored, for the first time, bulk soft edges of both oxygen and transition metal (iron) of the cathode material Li₂FeSiO₄ during one complete electrochemical cycle concurrently. Our results reveal that the redox mechanism relies primarily on the iron (cathodic) contribution. Nevertheless, a change in electron confinement of the oxygen suggests its active involvement in the charge compensation process (anodic). Moreover, we were able to support the experimentally observed changes in the electronic structure with ab initio-based simulation.

Photocharging has recently been demonstrated as a powerful method to improve the photoelectrochemical water splitting performance of different metal oxide photoanodes, including BiVO₄. In this work, we use ambient-pressure X-ray Raman scattering (XRS) spectroscopy to study the surface electronic structure of photocharged BiVO₄. The O K edge spectrum was simulated using the finite difference method near-edge structure program package, which revealed a change in electron confinement and occupancy in the conduction band. These insights, combined with ultraviolet-visible spectroscopy and X-ray photoelectron spectroscopy analyses, reveal that a surface layer formed during photocharging creates a heterojunction with BiVO₄, leading to favorable band bending and strongly reduced surface recombination. The XRS images presented in this work exhibit good agreement with soft X-ray absorption near-edge structure spectra from the literature, demonstrating that XRS is a powerful tool to study the electronic and structural properties of light elements in semiconductors. Our findings provide direct evidence of the electronic modification of a metal oxide photoanode surface as a result of the adsorption of electrolyte anionic species under operating conditions. This work highlights that the surface adsorption of these electrolyte anionic species is likely present in most studies on metal oxide photoanodes and has serious implications for the photoelectrochemical performance analysis and fundamental understanding of these materials.