7 records found
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Impact of spot defects on fault modeling and tests in dual-port memories
Simulation and development of short transparent tests for RAM
Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs
Realistic fault models and test procedure for multi-port SRAMs
A memory specific notation for fault modeling
Detecting unique faults in multi-port SRAMs
Development of a DRAM simulation model for fault analysis purposes