7 records found
1
Development of a DRAM simulation model for fault analysis purposes
Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs
Simulation and development of short transparent tests for RAM
Detecting unique faults in multi-port SRAMs
A memory specific notation for fault modeling
Impact of spot defects on fault modeling and tests in dual-port memories
Realistic fault models and test procedure for multi-port SRAMs