7 records found
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Detecting unique faults in multi-port SRAMs
Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs
Simulation and development of short transparent tests for RAM
A memory specific notation for fault modeling
Realistic fault models and test procedure for multi-port SRAMs
Development of a DRAM simulation model for fault analysis purposes
Impact of spot defects on fault modeling and tests in dual-port memories