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D Carbone
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X-ray nanodiffraction on a single SiGe quantum dot inside a functioning field-effect transistor
Journal article -
N Hrauda
,
J. Zhang
,
L.K. Nanver
,
J Moers
,
D Grutzmacher
,
G Baur
,
E Wintersberger
,
T Etzelstorfer
,
B Mandl
,
J Stangl
,
D Carbone
,
V Holy
,
V. Jovanovic
,
C Biasotto