Thermal stability of gas phase magnesium nanoparticles

Enhancement of proximity effects due to random roughness at a superconductor/metal interface.

Static and dynamic aspects of the demagnetizing factor in magnetic thin films with random rough surface.

Technology for nanoelectronic devises based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface.

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces.

Submonolayer growth of Co on H-passivated Si(100) surfaces metallization with Co on patterned H-Si (100).

Conductivity of quantum wires with boundary roughness scattering.

Roughness induced fluid interface fluctuations due to polar and apolar interactions.

Interface roughness fractality effects on the electron mobility in semiconducting quantum wells

NEXT: an experimental effort towards nanoelectronic devices

Roughness effects on the critical fracture toughness of materials under uniaxial stress

The temperature evolution of utra-thin films in solid-phase reaction of Co with Si(111) studied by scanning tunneling microscopy

Surface roughness and grain boundary scattering effects on the electical conductivity of thin films

Diffusion, nucleation and annealing of Co on the H-passivated Si(100) surface studied by UHV-STM

Roughness effects on the sliding frictoinal force of submonolayer liquid films on solid substrates

Effects on the fluid interface fluctuations due to the interaction potential form: Exponential interactions

Contact and alignment marker technology for atomic scale device fabrication

Static and Dynamic aspects of the rms-local durface slope of growing random surfaces

Study of fluid interface fluctuations within the generalised Dergaguin approximation

Fluctuation properties of interfaces and membranes bounded by rough surfaces