Thermal stability of gas phase magnesium nanoparticles

Technology for nanoelectronic devises based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface.

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces.

Conductivity of quantum wires with boundary roughness scattering.

Roughness induced fluid interface fluctuations due to polar and apolar interactions.

Submonolayer growth of Co on H-passivated Si(100) surfaces metallization with Co on patterned H-Si (100).

Enhancement of proximity effects due to random roughness at a superconductor/metal interface.

Static and dynamic aspects of the demagnetizing factor in magnetic thin films with random rough surface.

Diffusion, nucleation and annealing of Co on the H-passivated Si(100) surface studied by UHV-STM

The temperature evolution of utra-thin films in solid-phase reaction of Co with Si(111) studied by scanning tunneling microscopy

Surface roughness and grain boundary scattering effects on the electical conductivity of thin films

Interface roughness fractality effects on the electron mobility in semiconducting quantum wells

Roughness effects on the sliding frictoinal force of submonolayer liquid films on solid substrates

NEXT: an experimental effort towards nanoelectronic devices

Effects on the fluid interface fluctuations due to the interaction potential form: Exponential interactions

Roughness effects on the critical fracture toughness of materials under uniaxial stress

Contact and alignment marker technology for atomic scale device fabrication

Study of fluid interface fluctuations within the generalised Dergaguin approximation

Kinetic properties of particles forming rough surfaces

Roughness effects on the electrostatic-image potential near a dielectric interface