Thermal stability of gas phase magnesium nanoparticles

Submonolayer growth of Co on H-passivated Si(100) surfaces metallization with Co on patterned H-Si (100).

Technology for nanoelectronic devises based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface.

Static and dynamic aspects of the demagnetizing factor in magnetic thin films with random rough surface.

Conductivity of quantum wires with boundary roughness scattering.

Fabrication of Co/Si nanowires by ultrahigh-vacuum scanning tunneling microscopy on hydrogen-passivated Si(100) surfaces.

Roughness induced fluid interface fluctuations due to polar and apolar interactions.

Enhancement of proximity effects due to random roughness at a superconductor/metal interface.

Effects on the fluid interface fluctuations due to the interaction potential form: Exponential interactions

Roughness effects on the sliding frictoinal force of submonolayer liquid films on solid substrates

Surface roughness and grain boundary scattering effects on the electical conductivity of thin films

Roughness effects on the critical fracture toughness of materials under uniaxial stress

Contact and alignment marker technology for atomic scale device fabrication

Diffusion, nucleation and annealing of Co on the H-passivated Si(100) surface studied by UHV-STM

Interface roughness fractality effects on the electron mobility in semiconducting quantum wells

The temperature evolution of utra-thin films in solid-phase reaction of Co with Si(111) studied by scanning tunneling microscopy

NEXT: an experimental effort towards nanoelectronic devices

Surface roughness fractality effects in electrical conductivity of single metallic and semiconducting films

Fluctuation properties of interfaces and membranes bounded by rough surfaces

Study of fluid interface fluctuations within the generalised Dergaguin approximation