Library
search
Press enter to search in title/abstract
in title/abstract
in authors
local_library
Repository
J
JE Barth
View Pure Profile
Authored
20 records found
Beam brightness and STEM-EELS performance.
Conference paper -
JE Barth
SEM resolution improvement at low voltage with gun monochromator.
Conference paper -
JE Barth
,
MD Nijkerk
,
HW Mook
,
P. Kruit
Probe current, probe size, and the practical brightness for probe forming systems
Journal article -
MS Bronsgeest
,
JE Barth
,
LW Swanson
,
P. Kruit
Limits to the reduced brightness of the Zr/O/W Schottky emitter.
Conference paper -
AHV van Veen
,
JE Barth
,
C.W. Hagen
,
P. Kruit
Concept for a low energy foil corrector
Conference paper -
RH van Aken
,
C.W. Hagen
,
JE Barth
,
P. Kruit
Low-energy foil aberration corrector
Journal article -
RH van Aken
,
C.W. Hagen
,
JE Barth
,
P. Kruit
Electron optics of microlenses with inclined beams
Journal article -
Y Zhang
,
JE Barth
,
P. Kruit
Source brightness and useful beam current of carbon nanotubes and other very small emitters
Journal article -
P. Kruit
,
M Bezuijen
,
JE Barth
Influence of the microchannel plate and anode gap parameters on the spatial resolution of an image intensifier.
Journal article -
TH Hoenderken
,
C.W. Hagen
,
JE Barth
,
P. Kruit
,
GO Nützel
Design of an aberration corrected low-voltage SEM
Journal article -
RH van Aken
,
D.J. Maas
,
C.W. Hagen
,
JE Barth
,
P. Kruit
Aberration integrals for the low-voltage foil corrector
Journal article -
RH van Aken
,
M Lenc
,
JE Barth
Extracting the Boersch effect contribution from experimental energy spread measurements for Schottky electron emitters
Journal article -
MS Bronsgeest
,
JE Barth
,
GA Schwind
,
P. Kruit
,
LW Swanson
Reduced brightness of the ZrO/W Schottky electron emitter.
Journal article -
AHV van Veen
,
C.W. Hagen
,
JE Barth
,
P. Kruit
Theory and measurements of the Zr/O/W Schottky emitter.
Report -
AHV van Veen
,
JE Barth
,
C.W. Hagen
,
P. Kruit
High resolution STEM probe size dependence on probe current and beam brightness
Conference paper -
JE Barth
,
P. Kruit
Stochastic coulomb interactions in ion projection lithography systems with aberration-broadened crossover
Journal article -
P. Kruit
,
JE Barth
,
G Lammer
,
A Chalupka
,
H Vonach
,
H Löschner
,
G Stengl
Extrapolation of the Coulomb interaction blur reduction due to spherical aberration to the axis
Report -
P. Kruit
,
JE Barth
Dependence of the chromatic aberration spot size on the form of the energy distribution of the charged particles.
Journal article -
JE Barth
,
MD Nijkerk
Feasibility study for a high brightness X-ray source of 1 micro-meter focal spot diameter
Report -
EH Mulder
,
JE Barth
,
C.W. Hagen
,
P. Kruit
Throughput in ion beam projection lithography
Report -
JE Barth
,
P. Kruit