5 records found
1
Angular dependence of the ion-induced secondary electron emission for He(+) and Ga(+) beams
High Resolution Scanning Ion Microscopy
Simulation of ion imaging: Sputtering, contrast, noise
On the influence of the sputtering in determining the resolution of a Scanning Ion Microscope
Sputtering limits versus signal-to-noise limits in the observation of Sn balles in a Ga+ microscope
