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M Huefner
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Authored
2 records found
Scanning gate microscopy measurements on a superconducting single-electron transistor
Journal article -
M Huefner
,
M Hilke
,
U. Staufer
Integration of a fabrication process for an aluminum single-electron transistor and a scanning force probe for tuning-fork-based probe microscopy
Journal article -
K Suter
,
T Akiyama
,
NF de Rooij
,
M Huefner
,
U. Staufer