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document
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Guo, Y. (author)
Electron tomography is a powerful tool in materials science to characterize nanostructures in three dimensions (3D). In scanning transmission electron microscopy (STEM), the sample under study is exposed to a focused electron beam and tilted to obtain twodimensional (2D) projections at different angles; many imaging modes are available such as...
doctoral thesis 2020
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document
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Guo, Y. (author), Aveyard, R.A. (author), Rieger, B. (author)
In this paper, we present a multichannel cross-modal fusion algorithm to combine two complementary modalities in electron tomography: X-ray spectroscopy and scanning transmission electron microscopy (STEM). The former reveals compositions with high elemental specificity but low signal-to-noise ratio (SNR), while the latter characterizes the...
journal article 2019
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