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document
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Shen, Chunguang (author), Wang, Chenchong (author), Huang, Minghao (author), Xu, Ning (author), van der Zwaag, S. (author), Xu, W. (author)
We present an electron backscattered diffraction (EBSD)-trained deep learning (DL) method integrating traditional material characterization informatics and artificial intelligence for a more accurate classification and quantification of complex microstructures using only regular scanning electron microscope (SEM) images. In this method, EBSD...
journal article 2021
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