De Vreede, L. (author), Pelk, M.J. (author) Loss-compensating circuit for use when analysing electrical properties, such as largesignal properties, of an electronic device to be tested (1) by means of an impedance tuner (6; 7). The loss-compensating circuit (15) comprises two symmetrically positioned negative impedance elements (26, 27) separated by a phase shift network (17; 28; 30). By...
patent 2004