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Wei, X. (author), Urbach, Paul (author), van der Walle, Peter (author), Coene, W.M.J.M. (author)
We present a parameter retrieval method which incorporates prior knowledge about the object into ptychography. The proposed method is applied to two applications: (1) parameter retrieval of small particles from Fourier ptychographic dark field measurements; (2) parameter retrieval of a rectangular structure with real-space ptychography. The...
journal article 2021
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Wei, X. (author), Urbach, Paul (author), Coene, W.M.J.M. (author)
We investigate the performance of ptychography with noisy data by analyzing the Cramér-Rao lower bound. The lower bound of ptychography is derived and numerically computed for both top-hat plane wave and structured illumination. The influence of Poisson noise on the ptychography reconstruction is discussed. The computation result shows that,...
journal article 2020
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